Yuri Zarnitsky

Contact Information:

Tel: 972-8-9342100
Fax: 972-8-9343491
Bldg.: K.B. Weissman Institute of Physical Sciences
Room: 128
Email: Yuri.Zarnitsky at weizmann.ac.il

Major research interests:

X-ray plasma spectroscopy, gas-discharge light (UV) sources, weakly-ionized plasma turbulence.

List of publications:

2022

• Maron, Y., Bernshtam, V., Zarnitsky, Y., Fisher, V., Nedostup, O., Ampleford, D. J., Jennings, C. A., Jones, B., Cuneo, M. E., Rochau, G. A., Dunham, G. S., and Loisel, G. P.
  Domination of the K-Radiation at a Z-Pinch Stagnation on Z by Numerous Tiny Spots and the Properties of the Spots Inferred by Experimental Determination of the K-Line Opacities
  In 2022 IEEE International Conference on Plasma Science (ICOPS) (IEEE, 2022), pp. 1.

2014

• Giuliani, J. L., Thornhill, J. W., Kroupp, E., Osin, D., Maron, Y., Dasgupta, A., Apruzese, J. P., Velikovich, A. L., Chong, Y. K., Starobinets, A., Fisher, V., Zarnitsky, Yu., Bernshtam, V., Fisher, A., Mehlhorn, T. A., and Deeney, C.
  Effective versus ion thermal temperatures in the Weizmann Ne z-pinch: Modeling and stagnation physics
  Phys. Plasmas 21, 031209 (2014).

2012

• Blesener, K.S., Pikuz, S.A., Shelkovenko, T.A., Blesener, I.C., Hammer, D.A., Maron, Y., Bernshtam, V., Doron, R., Weingarten, L., and Zarnitsky, Y.
  Measuring magnetic fields in single aluminum wire plasmas with time-resolved optical spectroscopy
  High Energy Density Physics 8, 224–226 (2012).

2009

• V. A. Bernshtam, Yu. Zarnitsky, Yu. Ralchenko, L. A. Vainshtein, L. Weingarten, and Y. Maron
  Effect of radiative cascades on intensities of dielectronic satellites to He_α
  Phys. Scr. 79, 035303 (2009).

2003

• E. Kroupp, D. Carasso, D. Osin, A. Starobinets, V. Bernshtam, V.I. Fisher, Yu. Ralchenko, Yu. Zarnitsky, Y. Maron, I. Uschmann, E. Forster, and A. Fisher
  High-resolution spectroscopic X-ray diagnostics for studying the ion kinetic energy and plasma properties in a Z-pinch at stagnation
  In Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International No. 1 (2003), pp. 209–212.